Atomic Analytics LLC specializes in analytical STEM analysis of advanced materials of interest to the nano-technology, medical, chemical, and semiconductor industries. We have advanced capabilities in X-RAY and EELS profiling, mapping, and analysis.
We utilize a JEOL 2010F 200 KeV field emission scanning transmission
GATAN digital camera
Digiscan II for quantitative EELS profiling and mapping.
Emispec EsVision STEM control system for x-ray mapping and profiling.
We provide services on a per hour or contract basis. We also do development work for special material characterization needs on a contract basis.